ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,890, issued on July 21, was assigned to Micron Technology Inc. (Boise, Idaho). "Program verify level adjustment for program operation in a ... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,891, issued on July 21, was assigned to Micron Technology Inc. (Boise, Idaho). "Sensing time adjustment for program operation in a memory d... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,892, issued on July 21, was assigned to Winbond Electronics Corp. (Taichung City, Taiwan). "Method of optimizing erasure and programming pa... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,893, issued on July 21, was assigned to Beijing PXMicro Technology Co. Ltd. (Beijing). "Flash memory cell, writing method and erasing metho... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,894, issued on July 21, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.). "Reducing interference methods for 3D multiple-channe... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,895, issued on July 21, was assigned to Kioxia Corp. (Tokyo). "Semiconductor memory device, memory system, and control method" was invented... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,896, issued on July 21, was assigned to INTEL NDTM US LLC (Santa Clara, Calif.). "Deck reset read" was invented by Chao Zhang (Milpitas, Ca... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,897, issued on July 21, was assigned to Micron Technology Inc. (Boise, Idaho). "Known-failure error handling in a memory sub-system" was in... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,898, issued on July 21, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Method of operating nonvolatile memory devic... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,899, issued on July 21, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Device providing improved fail bit count ope... Read More